Random Quote
"To kill an error is as good a service as, and sometimes even better than, the establishing of a new truth or fact." -- Charles DarwinAdditional Resources
| IEEE publishes new 1149.7 jtag spec |
| Friday, 19 February 2010 21:06 |
|
1149.7 or 'cJtag' for Compact Jtag is a 2 wire test interface that is sure to get broad acceptance. Tool vendors are also lining up to support this standard. According to the IEEE, the new and enhanced features include significantly decreased scan-chain lengths; well-defined power control functions, including four selectable power modes; support for two-pin operation, instruction, and custom pin usage; new test tools such as chip bypass and star topology testing; increased port efficiency; and background data transfers concurrent with advanced scan transactions. "IEEE 1149.7 offers a flexible, dynamic solution for designers and engineers contending with shifting design paradigms without eroding the firm foundation established by earlier standards, such as IEEE 1149.1," said Stephen Lau, emulation technology product manager at Texas Instruments, in a prepared statement. "The combination of an extraordinary level of customizability with already-proven technologies maximizes IEEE 1149.7's effectiveness, ensuring its role as an essential, cost-effective test and debug tool." The primary web site for this standard is at grouper.ieee.org/groups/1149/7. See article at dftdigest.com with a good summary of announcements. See link here. |
Copyright © 2010 ATEForum , all rights reserved.
Random Pic
