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| Teradyne Users Group 2010 Registration Opens |
| Friday, 05 February 2010 17:54 |
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Conference dates May 3-5 Hilton Head SC. Quinn Horn, Ph.D., P.E. will present this year’s keynote address: “Powering the Mobile World: When Batteries go Bad.” Dr. Horn is a Senior Managing Engineer at Exponent Failure Analysis Associates, where he consults in the areas of metallurgy and electrochemistry, including corrosion analysis, battery manufacturing and battery science. In the field of battery technology, his work addresses a broad range of issues including material selection and testing, cell design, cell manufacturing, performance degradation, accelerated life testing, and due diligence technology evaluation. “TUG is the test industry's largest and longest running customer user group conference,” said Johnny Steck, product and test engineering manager, Texas Instruments and TUG 2010 chairperson. “In addition to a program full of tutorials, technical presentations and workshops, focused on digital, mixed-signal, power management/automotive, production integration & hardware/software interface, RF/wireless and Defense & Aerospace, the steering committee has added informative hardware and software tutorials for the 2010 conference.” The 2010 Semiconductor program will run for three full days, and the Defense & Aerospace program for two. Various companies providing products and services that interface with Teradyne systems will once again exhibit at a vendor fair session during the conference and share their information with attendees. The TUG 2010 program is now available at the TUG web site, where customers can review the technical program and register for the conference on line. Special TUG rates at the Hilton Head Marriott and special TUG pre-registration discounts are available until April 2, 2010. To learn more about TUG and to register for this year's exciting conference, visit the TUG web site at http://www.teradyne.com/tug. |
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